Quote
A. Walsemann, M. Karagounis, A. Stanitzki, and D. Tutsch, "Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications," Journal of Instrumentation, vol. 19, pp. C02012-C02012, 2024.
Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications
Fast facts
Internal authorship
Further publishers
Alexander Walsemann, Alexander Stanitzki, Dietmar Tutsch
Publishment
- 2024
Anthology
Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications
Title of the conference proceedings
19
Journal
Journal of Instrumentation
Organizational unit
Subjects
- Micro- and nanoelectronics
Research fields
- Learning Chips Lab (LCL)
Publication format
Journal article (Article)