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Upgrade of the Belle II vertex detector with depleted monolithic CMOS active pixel sensors

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    R. Boudagga, D. Auguste, M. Babeluk, M. Barbero, P. Barrillon, J. Baudot, T. Bergauer, F. Bernlochner, G. Bertolone, C. Bespin, S. Bettarini, A. Bevan, M. Bona, J. Bonis, F. Bosi, P. Breugnon, Y. Buch, G. Casarosa, L. Corona, J. Dingfelder, A. Dorokhov, G. Dujany, L. Federici, A. Fernandez Prieto, C. Finck, F. Forti, D. Fougeron, A. Frey, A. Gabrielli, L. Gaioni, A. Gallas Torreira, X. Gao, S. Giroletti, J. Gong, K. Hara, T. Higuchi, A. Himmi, D. Howgill, C. Hu-Guo, C. Irmler, D. Jeans, A.B. Kaliyar, T. Kishishita, H. Krüger, A. Kumar, C. Lacasta, C. Marinas, M. Massa, L. Massaccesi, J. Mazorra de Cos, M. Minuti, A. Moggi, L. Molina-Bueno, S. Mondal, M. Maushart, F. Morel, K.R. Nakamura, Y. Okazaki, Y. Onuki, P. Pangaud, Y. Peinaud, H. Pham, B. Pilsl, L. Ratti, V. Re, E. Riceputi, I. Ripp-Baudot, G. Rizzo, L. Schall, C. Schwanda, B. Schwenker, M. Schwickardi, R. Sefri, J. Serrano, W. Song, P. Stavroulakis, G. Traversi, I. Valin, V. Vobbilisetti, M. Vogt, S. Wang, Dr. Michael Winter, D. Xu

  • Veröffentlichung

    • Elsevier (Amsterdam [u.a.]) 2025
  • Publikationszweck

  • Organisationseinheit

  • Fachgebiete

    • Elektrotechnik allgemein
  • Forschungsfeld

    • Anderes Forschungsfeld

Zitat

R. Boudagga, D. Auguste, M. Babeluk, M. Barbero, P. Barrillon, J. Baudot, T. Bergauer, F. Bernlochner, G. Bertolone, C. Bespin, S. Bettarini, A. Bevan, M. Bona, J. Bonis, F. Bosi, P. Breugnon, Y. Buch, G. Casarosa, L. Corona, J. Dingfelder, A. Dorokhov, G. Dujany, L. Federici, A. Fernandez Prieto, C. Finck, F. Forti, D. Fougeron, A. Frey, A. Gabrielli, L. Gaioni, A. Gallas Torreira, X. Gao, S. Giroletti, J. Gong, K. Hara, T. Higuchi, A. Himmi, D. Howgill, C. Hu-Guo, C. Irmler, D. Jeans, A. B. Kaliyar, M. Karagounis, T. Kishishita, H. Krüger, A. Kumar, C. Lacasta, C. Marinas, M. Massa, L. Massaccesi, J. Mazorra de Cos, M. Minuti, A. Moggi, L. Molina-Bueno, S. Mondal, M. Maushart, F. Morel, K. R. Nakamura, Y. Okazaki, Y. Onuki, P. Pangaud, Y. Peinaud, H. Pham, B. Pilsl, L. Ratti, V. Re, E. Riceputi, I. Ripp-Baudot, G. Rizzo, L. Schall, C. Schwanda, B. Schwenker, M. Schwickardi, R. Sefri, J. Serrano, W. Song, P. Stavroulakis, G. Traversi, I. Valin, V. Vobbilisetti, M. Vogt, S. Wang, M. Winter, and D. Xu, “Upgrade of the Belle II vertex detector with depleted monolithic CMOS active pixel sensors,” Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 1080, p. 170677, 2025 [Online]. Available: https://www.sciencedirect.com/science/article/pii/S0168900225004784

Abstract

The Belle II experiment at the SuperKEKB collider in Japan, which currently holds the world luminosity record for electron–positron collisions, plans to upgrade its vertex detector (VXD) to operate at a target luminosity of 6×1035 cm−2s−1. A new pixelated vertex detector (VTX) is under development, utilizing a monolithic CMOS pixel sensor named OBELIX (Optimized BELle II pIXel). The VTX design incorporates 5–6 layers with a total material budget below 2.5% X0. All layers will employ the OBELIX, adapted from the TJ-Monopix2 sensor initially designed for the ATLAS Inner Tracker (ITk) upgrade. The OBELIX sensor, designed using a 180 nm CMOS process, features an enhanced pixel matrix and additional functionalities compared to its predecessor. Laboratory tests and test beam characterization results on irradiated and unirradiated TJ-Monopix2 sensors have yielded promising results, confirming the key performance parameters for the OBELIX design. This paper reviews the overall design of the VTX and the OBELIX sensor and presents the latest results of the in-beam characterization of the TJ-Monopix2.

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