C. Wolff, P. Schulz, J. Rettkowski, N. Sleibi, S. Trimech, and C. Hensen, “Continuous Integration for Electronic Products–Enabled by Digital Twins,” in 2025 IEEE 13th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS), Piscataway, NJ: IEEE, 2025, pp. 1–7. doi: 10.1109/idaacs68557.2025.11322082
P. Schulz, N. Sleibi, C. Wolff, and C. Hensen, “Could an open-source approach to test systems help the embedded systems industry?,” in 2024 IEEE AUTOTESTCON, New York, NY: IEEE, 2024, pp. 1–6. doi: 10.1109/autotestcon47465.2024.10697501
P. Schulz, N. Sleibi, S. Trimech, A. Aldaghamin, and C. Wolff, “Cloud-Based Production Testing with a Cyber Physical Test System,” in 2023 IEEE AUTOTESTCON, Piscataway, NJ: IEEE, 2023, pp. 1–7. doi: 10.1109/autotestcon47464.2023.10296208
N. Sleibi, A. Aldaghamin, and C. Wolff, “Automating Distributed Production Testing,” in 2022 IEEE 5th International Conference and Workshop Óbuda on Electrical and Power Engineering (CANDO-EPE), Piscataway, NJ: IEEE, 2022, pp. 147–152. doi: 10.1109/cando-epe57516.2022.10046366
P. Schulz, N. Sleibi, P. Tendyra, A. Aldaghamin, and C. Wolff, “Cloud Connectivity of a Distributed Cyber Physical Test System,” in 2020 IEEE 6th World Forum on Internet of Things (WF-IoT), Piscataway, NJ: IEEE, 2020, pp. 1–5.
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